Patent · US Expired

Interdigitated capacitor and method of manufacturing thereof

US6927125B2 · kind B2 · utility

17Cited by
7References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 11, 2004
Grant dateAug 9, 2005
Priority date
Expiry dateFeb 11, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/212

Abstract

The present invention provides a method of manufacturing an interdigitated semiconductor device. In one embodiment, the method comprises simultaneously forming first electrodes adjacent each other on a substrate, forming a dielectric layer between the first electrodes, and creating a second electrode between the first electrodes, the second electrode contacting the dielectric layer between the first electrodes to thereby form adjacent interdigitated electrodes. An interdigitated capacitor and a method of manufacturing an integrated circuit having an interdigitated capacitor are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.