Detection of a variation in the environment of an integrated circuit
US6927580B2 · kind B2 · utility
4Cited by
6References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 4, 2002 |
| Grant date | Aug 9, 2005 |
| Priority date | — |
| Expiry date | Sep 21, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K19/07372
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present or measured delay with at least one reference value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.