Patent · US Expired

Method and system for reducing leakage current in integrated circuits using adaptively adjusted source voltages

US6927619B1 · kind B1 · utility

23Cited by
5References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 6, 2002
Grant dateAug 9, 2005
Priority date
Expiry dateMay 15, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/0013
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

An apparatus for reducing leakage currents in an integrated circuit having logic gates containing PMOS devices and NMOS devices. The apparatus comprises a power management unit capable of: i) applying a fixed VDD supply voltage to body connections of said PMOS devices; ii) applying a fixed VSS supply voltage to body connections of said NMOS devices; iii) applying an adjustable PMOS source voltage to sources of said PMOS devices; and iv) applying an adjustable NMOS source voltage to sources of said NMOS devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.