Innovative bypass circuit for circuit testing and modification
US6928581B1 · kind B1 · utility
2Cited by
19References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 14, 1999 |
| Grant date | Aug 9, 2005 |
| Priority date | — |
| Expiry date | Dec 5, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31707
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit module is designed with bypass switches in critical places to route signals around specific circuit blocks, e.g. an automatic gain control (AGC) system and an anti-aliasing filter. If there had been significant problems with either block, it can be bypassed and tests of the remaining circuits are possible. This allows all circuits in the module to be tested in the initial pass, reducing the risk of needing a third pass after the known problems were fixed in the second pass. Additionally, the bypass circuits are useful at module production test and for diagnostics in the final product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.