Two-stage actuation clamp for electrical device under test (DUT) with DUT-linked double action
US6929255B2 · kind B2 · utility
2Cited by
3References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 24, 2003 |
| Grant date | Aug 16, 2005 |
| Priority date | — |
| Expiry date | Oct 3, 2023 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49998
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A novel two-stage clamp used in testing a device-under-test (DUT) is herein presented. The two-stage clamp provides two sequential actuations via one linear force, and includes clamps moving in multiple different directions. The two-stage clamp uniquely uses the DUT being clamped to provide the linkage and timing for the two-stage actuation of clamps moving in three different directions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.