Measurement system for multiple optical components
US6930767B2 · kind B2 · utility
2Cited by
3References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 11, 2003 |
| Grant date | Aug 16, 2005 |
| Priority date | — |
| Expiry date | Feb 25, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/332
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test and measurement system may include a light source coupled to a 1×(N+M) switch that supplies signals to devices under test as well as reference channels. The outputs from each channel of each device under test, as well as the reference channels, are provided to M 2×(N+1) routing switches in one embodiment. The routing switches are then coupled to M channel detector modules. As a result, it is not necessary to connect and disconnect the switches, making long-term environmental tests viable while avoiding losses from disconnecting and connecting switches in the course of ongoing testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.