Patent · US Expired

Spectral imaging

US6930773B2 · kind B2 · utility

35Cited by
26References
44Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 23, 2002
Grant dateAug 16, 2005
Priority date
Expiry dateMay 23, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/6421
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method is described that includes measuring, at each of a set of W wavelength bins, a spectral response of at least one region of a sample stained with multiple stains, and determining the concentration of at least one of the stains in the region of the sample based in part on the spectral responses, the wavelength bins being chosen so that a matrix of elements that represent the responses of the stains at the wavelength bin has an inverse for which a mathematical stability is maximum relative to the inverses of other matrices of elements that represent the responses of the stains for other possible sets of wavelength bins.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.