Method for determining formation quality factor from seismic data
US6931324B2 · kind B2 · utility
14Cited by
1References
12Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 16, 2003 |
| Grant date | Aug 16, 2005 |
| Priority date | — |
| Expiry date | Oct 16, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/63
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is disclosed for calculating the quality factor Q from a seismic data trace. The method includes calculating a first and a second minimum phase inverse wavelet at a first and a second time interval along the seismic data trace, synthetically dividing the first wavelet by the second wavelet, Fourier transforming the result of the synthetic division, calculating the logarithm of this quotient of Fourier transforms and determining the slope of a best fit line to the logarithm of the quotient.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.