Measurement interface optimized for both differential and single-ended inputs
US6931331B2 · kind B2 · utility
2Cited by
7References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 30, 2003 |
| Grant date | Aug 16, 2005 |
| Priority date | — |
| Expiry date | Jan 21, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K5/2481
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Offset adjustments for both differential and single-ended measurements are accomplished in the same probe or system. Different variable offsets are provided for the positive and negative inputs of a differential amplifier, and a variable offset adjustment is provided to remove differential amplifier output offset. Common mode and reduced dynamic range problems for both differential and single-ended measurements are eliminated. All or desired portions of required functions may be implemented using discrete or DSP approaches.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.