Method and system for identifying representative trends using sketches
US6931400B1 · kind B1 · utility
6Cited by
5References
40Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 27, 2002 |
| Grant date | Aug 16, 2005 |
| Priority date | — |
| Expiry date | Jul 12, 2023 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99943
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for identifying representative data trends using sketches. A sketch is a lower dimensional vector used to represent higher dimensional data. The properties of sketches include data dimensionality reduction, sketches synthesized from other sketches, and the distance between sketches comparable to the distance between the data the sketches represent. Exemplary embodiments include identifying relaxed periods and average trends.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.