Patent · US Expired

System, method, and apparatus for testing a head gimbal assembly

US6934111B2 · kind B2 · utility

2Cited by

6References

18Claims

0Family size

Assignee

Hitachi Global Storage Technologies Netherlands B.V. · NL

Inventors

Rainer Krause · Hochheim, DE
Edgar Maehringer-Kunz · Sindelfingen, DE

Key dates

Filing date	Jul 8, 2003
Grant date	Aug 23, 2005
Priority date	—
Expiry date	Dec 23, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG11B5/5547
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

The invention relates to a method and a system for testing a head gimbal assembly, the system comprising means (54) for inputting a control command to perform a long seek operation, means (55) for measuring the mechanical frequency response of the head gimbal assembly to the long seek operation, and means (57) for comparing the frequency response to a master frequency response (58).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.