Sample holder for differential thermal analysis
US6935776B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 9, 2003 |
| Grant date | Aug 30, 2005 |
| Priority date | — |
| Expiry date | Jun 9, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/486
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.