Image sensor signal defect correction
US6940549B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2001 |
| Grant date | Sep 6, 2005 |
| Priority date | — |
| Expiry date | Jul 10, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/68
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In a method of correcting defects in image data comprising an array of pixels, the intensity of pixels of the image data in each side of the defect is sampled (5), differences between the samples intensities are calculated (6) to generate intensity difference signals (D1-D4) indicative of intensity differences across and on respective sides of the defect, and the defect is corrected (7-11) in dependence on the intensity difference signals (D1-D4). Preferably, depending on the intensity difference signals (D1-D4) either an average correction technique or no defect pixel correction is used, the average correction technique being used if the intensity difference signals do not exceed a predetermined level value (L1,L2).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.