Patent · US Expired

Method for fabricating integrated circuit package with solder bumps

US6943060B1 · kind B1 · utility

2Cited by
7References
25Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 5, 2004
Grant dateSep 13, 2005
Priority date
Expiry dateMar 5, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49144
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor package with solder bumps and a method for making the same are described. One embodiment comprises a flip-chip design with a rectangular semiconductor die with a relatively large aspect ratio bonded to a substantially square substrate through solder bumps. In one embodiment, active bumps are concentrated in an area relatively close to the neutral point of the die, for example, in a substantially square area about the neutral point.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.