Probe tone S-parameter measurements
US6943563B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 2, 2002 |
| Grant date | Sep 13, 2005 |
| Priority date | — |
| Expiry date | May 2, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An S-parameter measurement technique allows measurement of devices under test (DUTs), such as power amplifiers, which require a modulated power tone drive signal for proper biasing, in combination with a probe tone test signal, wherein both the modulated and probe tone signals operate in the same frequency range. The technique uses a stochastic drive signal, such as a CDMA or WCDMA modulated signal in combination with a low power probe tone signal. A receiver in a VNA having a significantly narrower bandwidth than the modulated signal bandwidth enables separation of the modulated and probe tone signals. VNA calibration further improves the measurement accuracy. For modulated signals with a significant power level in the frequency range of the probe tone signal, ensemble averaging of the composite probe tone and power tone signals is used to enable separation of the probe tone signal for measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.