Z-slope test to optimize sample throughput
US6943791B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2002 |
| Grant date | Sep 13, 2005 |
| Priority date | — |
| Expiry date | Sep 5, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/28
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method are disclosed for utilizing a Z slope test to select polygons that may be candidates for multiple storage methods. The method may calculate the absolute Z slope from vertex data and compare the calculated value with a specified threshold value. In some embodiments, for polygons that have an absolute Z slope less than the threshold value, parameter values may be rendered for only one sample position of multiple neighboring sample positions. The parameter values rendered for the one sample position may then be stored in multiple memory locations that correspond to the multiple neighboring sample positions. In some embodiments, storing parameter values in multiple memory locations may be achieved in a single write transaction. In some embodiments, utilization of the Z slope test method may be subject to user input and in other embodiments may be a dynamic decision controlled by the graphics system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.