Method for selection of optical fiber and system for inspection of optical fiber
US6943872B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2003 |
| Grant date | Sep 13, 2005 |
| Priority date | — |
| Expiry date | Dec 4, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3145
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical fiber inspecting system 1A comprises a waveform measuring unit 2 for measuring an OTDR waveform for an optical fiber F to be inspected and a waveform evaluating unit 3 for evaluating an anomaly within the optical fiber. The waveform evaluating unit 3 comprises a calculating part 4 and a detecting part 5. The calculating part 4 calculates the gradient and the amount of change in gradient of the waveform at each time point. The detecting part 5 determines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively. This realizes an optical fiber inspecting system, an inspection method and a selecting method, all of which enable to detect reliably an anomaly within an optical fiber through an OTDR waveform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.