Patent · US Expired

Interferometric measuring device

US6943895B2 · kind B2 · utility

4Cited by
3References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 2001
Grant dateSep 13, 2005
Priority date
Expiry dateSep 12, 2021

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B5/0084
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

The interferometric measuring device (1) for measuring the shape of a surface of an object (O) has a radiation source (LQ), a beam splitter (ST) producing an object beam (OS) guided along an object light path to the object (O) and a reference beam (RS) guided along a reference light path to a reflective reference plane (RSP), an image recorder (BA) that records interfering radiation reflected by the object (O) and the reference plane (RSP) and an associated evaluation device (E) to determine the surface shape. A favorable adaptability and operation are achieved by arrangement of a fixed lens system (SO) that produces a fixed intermediate image (SZB) in the object light path and a movable lens system (BO) that is movable in a direction of its optical axis for depth scanning. The image recorder (BA) has pixels arranged next to each other on an extended planar surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.