Patent · US Expired

Memory modules and methods having a buffer clock that operates at different clock frequencies according to the operating mode

US6944737B2 · kind B2 · utility

14Cited by
7References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2002
Grant dateSep 13, 2005
Priority date
Expiry dateApr 16, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/401
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Memory modules and methods of testing memory modules are provided that include at least one memory device responsive to a memory clock signal having a memory clock frequency and a data buffer. The data buffer is responsive to a buffer clock signal having a first buffer clock frequency that is different from the memory clock frequency during a normal mode of operation and having a second buffer clock frequency that is equal to the memory clock frequency during a test mode of operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.