Method for testing an integrated circuit including hardware and/or software parts having a confidential nature

US6944778B2 · kind B2 · utility

Assignee

• EM Microelectronic-Marin SA · CH

Inventors

• Fabrice Walter · Neuchâtel, CH
• Hugues Blangy · Corges, CH

Key dates

• Filing date: Jan 18, 2001
• Grant date: Sep 13, 2005
• Expiry date: Apr 1, 2023

Classification

• Technology area (CPC H): Electricity
• CPC primary: H04L9/3226
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

This method uses a tester (T) capable of being connected to an integrated circuit (CI) to be tested.A random number (RNG-C) is generated and ciphered using a key (k) by a cipher algorithm to obtain a password (Gk(RNG)-C). The random number (RNG-C) is sent to the tester (T) in which the received random number (RNG-C) is ciphered using the same key (k) by a same cipher algorithm to generate therein a second password (Gk(RNG)-T). This latter is sent to the integrated circuit (CI) to be compared to the first password (Gk(RNG)-C). The test of the confidential parts (1) of the circuit is only authorised if the two passwords exhibit the required match.