Method of reducing ESD damage in thin film read heads which enables measurement of gap resistance
US6944937B2 · kind B2 · utility
6Cited by
4References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2003 |
| Grant date | Sep 20, 2005 |
| Priority date | — |
| Expiry date | Oct 28, 2023 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49078
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method of manufacturing a magnetoresistive read head which reduces electrostatic discharge and allows measurement of gap resistances in the head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.