Method and system for testing driver circuits of AMOLED
US6946307B2 · kind B2 · utility
4Cited by
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4Claims
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Key dates
| Filing date | Oct 27, 2003 |
| Grant date | Sep 20, 2005 |
| Priority date | — |
| Expiry date | Nov 10, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2300/0842
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and a system for testing circuits of an AMOLED before implantation of OLEDs are provided. Each circuit includes a terminal, connected to an OLED after the OLED is implanted, configured as a test point. The system selects one circuit to test. The method and the system extract a current signal from the test point, and then analyze it to determine the status of the circuit. The steps being repeated, all circuits of the AMOLED can be tested efficiently and precisely.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.