Method of orienting an axis of magnetization of a first magnetic element with respect to a second magnetic element, semimanufacture for obtaining a sensor, sensor for measuring a magnetic field
US6946834B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 2002 |
| Grant date | Sep 20, 2005 |
| Priority date | — |
| Expiry date | Feb 5, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/09
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of orienting the axis of magnetization of a first magnetic element with respect to a second magnetic element uses a first element and a second element lying on a substrate. Each of the elements has a magnetic layer with an axis of magnetization. The method includes depositing a pattern of flux-concentrating material close to the first element and subsequently orienting the axis of magnetization of the first element in an applied magnetic field. The semi-finished article for measuring a magnetic field includes a substrate, a first magnetic element, a second magnetic element, a third magnetic element and a fourth magnetic element on the substrate in a bridge configuration. A first bridge portion is provided wherein the first element and the second element are electrically connected in series. A second bridge portion is provided wherein the third element and the fourth element are electrically connected in series.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.