Patent · US Expired

Wafer level testing of optical components

US6947622B2 · kind B2 · utility

1Cited by

42References

22Claims

0Family size

Assignee

Kotura, Inc. · US

Inventors

Liwei Wang · Phoenix, US
Dazeng Feng · Arcadia, US
Xiaoming Yin · Tangxia, CN
Trenton Gary Coroy · Rancho Cucamonga, US

Key dates

Filing date	Jun 27, 2002
Grant date	Sep 20, 2005
Priority date	—
Expiry date	Oct 21, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG02B2006/12176
WIPO fieldOptics
WIPO sectorInstruments

Abstract

An optical device having one or more optical components is disclosed. A waveguide extends from an optical component to a testing port configured to receive a light signal from a position over the optical device and to insert the light signal into the waveguide. In some instances, the testing port is configured to receive a light signal from the waveguide and to direct the light signal to a location over the optical device. The optical device can be positioned on a wafer before being separated from the wafer. The waveguide can extend from an optical component over the perimeter of the optical device such that the testing ports are located outside the perimeter of the optical device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.