Method and system for diagnosing machine malfunctions
US6947797B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 24, 2002 |
| Grant date | Sep 20, 2005 |
| Priority date | — |
| Expiry date | Dec 5, 2023 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99948
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A system (830) and method (800) for diagnosing a malfunctioning machine. A fault event is selected (806) together with sequential operating parameter data (808) from a selectively focused time interval about the fault event for evaluation of a machine (810). The selectively focused time interval may include data occurring just before, just after, or spanning the fault event. Characterizing information such as slope, rate of change, and absolute sign of the data may be derived (809) from the operating parameter data over the selectively focused time interval and used in the diagnosis. The fault event and operating parameter data may be compared to existing cases in a case database (834). A set of rules (817) or candidate anomalies (841) may be executed over the operating parameter data to further improve the accuracy of the diagnosis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.