Patent · US Expired

Methods and apparatus for analyzing flutter test data using damped sine curve fitting

US6947858B2 · kind B2 · utility

4Cited by
10References
42Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 27, 2003
Grant dateSep 20, 2005
Priority date
Expiry dateJun 27, 2023

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB64F5/60
  • WIPO fieldTransport
  • WIPO sectorMechanical engineering

Abstract

Methods and apparatus for analyzing flutter test data using damped sine curve fitting. In one embodiment, a plurality of data points are read, with each data point representing an amplitude versus a test time. A number “N” of damped sine waves to fit to the plurality of data points is determined, and the number “N” of damped sine waves is fit to the plurality of data points using a non-linear “N” damped sine wave fitting algorithm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.