Patent · US Expired

High integrity recovery from multi-bit data failures

US6948091B2 · kind B2 · utility

59Cited by
6References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 2, 2002
Grant dateSep 20, 2005
Priority date
Expiry dateOct 13, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/1679
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

Methods and system for facilitating a computing platform to recover quickly from transient multi-bit data failures within a run-time data memory array in a manner that is transparent to software applications executing on the computing platform. A fault-tolerant digital computing system is provided for that utilizes parallel processing lanes in a lockstep architecture. Each processing lane includes error detectors that are configured to detect multi-bit data errors in each processing lane's memory arrays. Upon detection of a multi-bit data failure, an interrupt is generated wherein control logic software responds to the interrupt and corrects the data errors in the memory array of each processing lane.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.