Patent · US Expired

Method of multi-turn time-of-flight mass analysis

US6949736B2 · kind B2 · utility

31Cited by
2References
8Claims
0Family size

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Inventor

Key dates

Filing dateSep 3, 2004
Grant dateSep 27, 2005
Priority date
Expiry dateSep 3, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/0036
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of mass analysis using a multi-turn time-of-flight mass spectrometer starts with recording plural heterogeneous turn number spectra F1(t), F2(t), . . . , Fq(t) containing plural ion peaks that might be different in number of turns, the spectra being obtained with different ion residence times taken from entry to departure using a multi-correlation function for reconstructing a single turn number spectrum.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.