Method and system for built in testing of switch functionality of tunable capacitor arrays
US6949935B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2002 |
| Grant date | Sep 27, 2005 |
| Priority date | — |
| Expiry date | Jan 31, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method of testing switch functionality of a tunable capacitor array is disclosed. A built in test (BIT) circuit provides digital device for testing the functionality of a programmable switch capacitor array circuit. The method and system provides for switching a capacitor switch of a switch capacitor array between on and off, switching a test enable switch of a BIT circuit between on and off, pulling an internal node of the BIT circuit either high or low using a current source, and determining whether the internal node has been pulled either high or low. In addition, the method and system provides for making a pass or fail determination based on a determined state of the internal node.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.