Patent · US Expired

Differential capacitance measurement

US6949937B2 · kind B2 · utility

67Cited by
14References
50Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 13, 2004
Grant dateSep 27, 2005
Priority date
Expiry dateFeb 17, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/2605
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit and method are given, which realizes a stable yet sensitive differential capacitance measuring device with good RF-suppression and with very acceptable noise features for use in capacitive sensor evaluation systems. By evaluating the difference of capacitor values only—with the help of a switched capacitor front-end—large spreads of transducer capacitor values are tolerable. Furthermore a mode of operation can be set up, where no essential galvanic connection between sensor input and the active read-out input at any given time is existing. The solution found exhibits a highly symmetrical construction. Using the intrinsic advantages of that solution the circuit of the invention is manufactured as an integrated circuit with standard CMOS technology at low cost.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.