Backscatter imaging using Hadamard transform masking
US6950495B2 · kind B2 · utility
19Cited by
25References
18Claims
0Family size
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Key dates
| Filing date | Dec 1, 2003 |
| Grant date | Sep 27, 2005 |
| Priority date | — |
| Expiry date | Jan 25, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Backscatter imaging using Hadamard transform masking includes an area x-ray source with alternating, masked, Hadamard transform patterns. The total backscatter signal from a target for each pair of corresponding masks is recorded. The difference in signal strengths for each pair of corresponding masks is a direct measurement of the Hadamard transform coefficient for that mask. An image of the target is formed by performing an inverse discrete Hadamard transform on the complete matrix of coefficients.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.