Nondestructive inspection method and apparatus
US6950545B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 26, 2000 |
| Grant date | Sep 27, 2005 |
| Priority date | — |
| Expiry date | Oct 10, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/56
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.