System and method for precise location of a point of interest
US6950552B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2001 |
| Grant date | Sep 27, 2005 |
| Priority date | — |
| Expiry date | May 6, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/421
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A scanning system and method for locating a point within a region. The method may: 1) determine or locate a region of interest in the region; 2) determine one or more characteristics of the region of interest within the region, wherein the region of interest includes the point of interest; 3) determine a continuous trajectory based on the one or more characteristics of the region of interest; 4) measure the region of interest at a plurality of points along the continuous trajectory to generate a sample data set; 5) perform a surface fit of the sample data set using the approximate model to generate a parameterized surface; and 6) calculate a location of the point of interest based on the parameterized surface. The method may include measuring the region at and/or near the calculated location to confirm the solution, and may also include generating output comprising the results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.