Multi-purpose BER tester (MPBERT) for very high RZ and NRZ signals
US6950972B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2001 |
| Grant date | Sep 27, 2005 |
| Priority date | — |
| Expiry date | Dec 8, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3171
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-purpose bit error rate tester (MPBERT) and a method of bit error rate (BER) testing of electrical and optical components and subsystems of electrical and optical communications systems is provided. The invention provides for bit error rate testing both in the optical and the electrical domain, and for bit error rate testing at higher than achievable rates in the electrical domain by multiplexing and demultiplexing in the optical domain. An MPBERT constructed according to the invention incorporates at least one optical multiplexer, and advantageously incorporates at least one optical demultiplexer, and in some embodiments uses high data rate optical RZ to NRZ conversion and high data rate optical NRZ to RZ conversion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.