Interferometer alignment
US6952266B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 15, 2003 |
| Grant date | Oct 4, 2005 |
| Priority date | — |
| Expiry date | Jan 15, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B9/02061
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides means for correcting interferometer alignment errors through the use of corrective elements. The corrective elements allow reduced accuracy in the assembly process. Residual alignment errors caused by imprecise mounting of permanently mounted components can be corrected using relatively low precision positioning of corrector components. The technique can be particularly applicable to the mass production of interferometers, for which achieving and maintaining the required assembly tolerances might otherwise be prohibitively expensive. Interferometers according to the present invention can be used, for example, in optical spectroscopy and in interferometers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.