Patent · US Expired

Device for thermal treatment of substrates

US6953338B2 · kind B2 · utility

12Cited by
12References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 19, 2001
Grant dateOct 11, 2005
Priority date
Expiry dateJan 19, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68785
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The aim of the invention is to reduce the formation of scratches in a device for the thermal treatment of substrates, in particular, semiconductor substrates, in a chamber in which the substrate is placed upon support elements. According to the invention, said aim is achieved by means of displaceable support elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.