Microbolometer focal plane array with temperature compensated bias
US6953932B2 · kind B2 · utility
12Cited by
1References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2003 |
| Grant date | Oct 11, 2005 |
| Priority date | — |
| Expiry date | Dec 1, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/76
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A readout circuit for an array of substrate-isolated microbolometer detectors includes a bias source that varies in accordance with changes in substrate temperature as detected by a temperature sensor that has temperature characteristic that resembles the temperature characteristic of the microbolometer detector array so as compensate detector measurements for temperature induced errors in the microbolometer focal plane array read out.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.