Negative ion atmospheric pressure ionization and selected ion mass spectrometry using a 63NI electron source
US6956206B2 · kind B2 · utility
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Key dates
| Filing date | Oct 3, 2002 |
| Grant date | Oct 18, 2005 |
| Priority date | — |
| Expiry date | Oct 3, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/04
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
Negative ion atmospheric pressure ionization mass spectrometers and selected ion mass spectrometers with a 63Ni ion source and a drift tube for reaction of a sample with electrons from the 63Ni ion source prior to analysis of a sample by mass spectrometry are provided. Also provided are methods for chemically analyzing a sample by negative ion atmospheric pressure ionization mass spectrometry by exposing the sample to electrons from a 63Ni ion source in a drift tube and allowing the sample and electrons to react in the drift tube prior to analysis via mass spectrometry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.