Patent · US Expired

MEMS based charged particle deflector design

US6956219B2 · kind B2 · utility

4Cited by
13References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 12, 2004
Grant dateOct 18, 2005
Priority date
Expiry dateNov 12, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/1205
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A microcolumn including a plurality of beam modification components coupled to an assembly substrate, wherein the plurality of beam modification components includes: (1) an extractor component; (2) a first focusing electrode component; (3) a first anode component; (4) a first deflector component; (5) a second focusing electrode component; (6) a second deflector component; (7) a third focusing electrode component; (8) a third deflector component; (9) a second anode component; (10) a fourth focusing electrode component; and (11) a third anode component. The beam modification components may be ordered on the substrate in this sequence or other sequences.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.