Patent · US Expired

Apparatus and method for in-situ measurement of polymer quantities output from an extractor

US6956645B2 · kind B2 · utility

1Cited by

7References

38Claims

0Family size

Assignee

OSRAM Opto Semiconductors GmbH · DE

Inventors

Georg Wittman · Herzogenaurach, DE
Joerg Blaessing · Oberkochen, DE
Matthias Stoessel · Mannheim, DE
Jan Birnstock · Dresden, DE
Karsten Heuser · Erlangen, DE

Key dates

Filing date	Dec 20, 2002
Grant date	Oct 18, 2005
Priority date	—
Expiry date	Sep 23, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/9513
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Apparatus and procedure for the in situ measurement of quantities of polymer printed onto supportsA source of radiation 2 sends electromagnetic radiation onto a droplet 9, 10 of polymer solution or polymer dispersion, which is printed onto a support 4. A detector 3 measures the transmitted or re-emitted radiation. Controlled by a comparator device 6 and a control unit 5, the printing parameters are corrected in situ, if necessary. In this manner, a controlled adjustment of the layer thickness of organic light-emitting diodes and therefore luminosity and color perception can be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.