Patent · US Expired

Method and apparatus for quantifying tradeoffs for multiple competing goals in circuit design

US6957400B2 · kind B2 · utility

9Cited by
11References
39Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 29, 2003
Grant dateOct 18, 2005
Priority date
Expiry dateFeb 5, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/36
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

To identify high quality design points in a circuit design, a plurality of design points is generated for the circuit. A subset of the design points is allocated to a design population. A cost is then determined for each allocated design point. From a subset of the allocated design points, a plurality of new design points is generated for the circuit. The cost for each new design point is then determined and each new design point having a cost that is the same or more favorable than the most favorable cost associated with the allocated design points is allocated to the design population. The design points allocated to the design population can then be displayed for selection of one of said allocated design points having desired performances of the circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.