CMOS inspection apparatus
US6958768B1 · kind B1 · utility
10Cited by
5References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2000 |
| Grant date | Oct 25, 2005 |
| Priority date | — |
| Expiry date | Dec 8, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/00
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system for inspecting components is provided. The system includes a CMOS imaging system generating image data, such as pixel data from a pixel array. An image analysis system is connected to the CMOS imaging system, the image analysis system receiving the image data and generating image analysis data. The CMOS imaging system generates the image data at a rate that allows the CMOS imaging device to be used for inspecting components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.