Method for scanning microscopy; and scanning microscope
US6958858B2 · kind B2 · utility
25Cited by
21References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2002 |
| Grant date | Oct 25, 2005 |
| Priority date | — |
| Expiry date | Jul 29, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for scanning microscopy is disclosed. It contains the step of generating an illuminating light beam that exhibits at least a first substantially continuous wavelength spectrum whose spectral width is greater than 5 nm; the choosing of a second wavelength spectrum that is arranged spectrally within the first wavelength spectrum; the step of selecting the light of the second wavelength spectrum out of the illuminating light beam using an acoustooptical component; and the step of illuminating a specimen with the illuminating light beam. A scanning microscope is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.