Evaluating data handling devices by means of a marker impurity
US6959586B2 · kind B2 · utility
2Cited by
17References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2001 |
| Grant date | Nov 1, 2005 |
| Priority date | — |
| Expiry date | Jul 7, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B33/14
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention is a method for evaluating a multiplicity of data handling devices each having a sealed chamber with several interior surfaces. It uses an impurity chamber containing thousands of dispersed gas-borne particles that each contain a marker impurity that is substantially absent from all of the interior surfaces of at least one of the devices. That device is tested for vulnerability to external dust using the marker impurity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.