Patent · US Expired

Semiconductor device and manufacturing method thereof

US6960827B2 · kind B2 · utility

19Cited by
7References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 6, 2004
Grant dateNov 1, 2005
Priority date
Expiry dateJun 20, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3511
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A stacked-type semiconductor device has a reduced overall height and an improved reliability in the mechanical strength of the stacked structure. The semiconductor device also has an improved heat release characteristic. A first interposer has a surface on which first electrode pads are formed and a first semiconductor element is mounted with a circuit forming surface facing the first interposer. A second interposer has a surface on which second electrode pads are formed and a second semiconductor element is mounted with a circuit forming surface facing the second interposer. External connection terminals are provided on a surface of the second interposer opposite to the surface on which the second semiconductor element is mounted. The first and second interposers are electrically connected to each other by conductive members provided therebetween. A back surface of the first semiconductor element and a back surface of the second semiconductor element are fixed to each other by an adhesive.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.