Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies
US6960917B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2003 |
| Grant date | Nov 1, 2005 |
| Priority date | — |
| Expiry date | Nov 6, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/312
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method for testing continuity of electrical paths through a connector, pairs of contacts of the connector are coupled via a first plurality of passive circuit components. The contacts are also coupled to a test sensor port via a second plurality of passive circuit components, ones of which are coupled in parallel to the test sensor port. The method proceeds with stimulating one or more nodes of the connector, and then measuring an electrical characteristic via the test sensor port. Finally, the measured electrical characteristic is compared to at least one threshold to assess continuities of at least two electrical paths through the connector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.