System and method for testing video devices using a test fixture
US6961885B2 · kind B2 · utility
5Cited by
13References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2001 |
| Grant date | Nov 1, 2005 |
| Priority date | — |
| Expiry date | Feb 24, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318536
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are provided for testing a device. A test fixture is provided for interfacing a device with a host system for generating tests to be run on the device. The device is placed in a scan-test mode, according to a built-in self-test of the device. A scan clock signal and scan pattern are provided to allow scan-tests to be run on the device. If the device passes the scan test, the device is placed in a real-time test mode. At-speed tests may then be run on the device to provide a robust test and identify portions of the device that may be faulty.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.