Determination of layer thickness or non-uniformity of layer thickness based on fluorophore additives
US6962670B1 · kind B1 · utility
16Cited by
40References
32Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2000 |
| Grant date | Nov 8, 2005 |
| Priority date | — |
| Expiry date | Jul 15, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/646
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a method for measuring the thickness, or non-uniformity of thickness, of one or more layers of a film or article such as a preform. At least one layer contains a known concentration and a substantially uniform distribution of fluorophores. The fluorophores are added to the one or more layers in sufficient quantity to impart fluorescence capable of detection by a detector when exposed to electromagnetic radiation at absorbing wavelengths. The layers of the invention may be made from polymeric material, non-polymeric material, or combinations thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.