Patent · US Expired

Mass defect labeling for the determination of oligomer sequences

US6962818B2 · kind B2 · utility

13Cited by
26References
51Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 19, 2001
Grant dateNov 8, 2005
Priority date
Expiry dateMay 28, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/25125
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Mass tagging methods are provided that lead to mass spectrometer detection sensitivities and molecular discriminations that are improved over other methods. In particular the methods are useful for discriminating tagged molecules and fragments of molecules from chemical noise in the mass spectrum. These mass tagging methods are useful for oligomer sequencing, determining the relative abundances of molecules from different samples, and identifying individual molecules or chemical processing steps in combinatorial chemical libraries. The methods provided are useful for the simultaneous analysis of multiple molecules and reaction mixtures by mass spectrometric methods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.