Systems and methods for integrated emissivity and temperature measurement of a surface
US6963816B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 2, 2003 |
| Grant date | Nov 8, 2005 |
| Priority date | — |
| Expiry date | Nov 5, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/125
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-channel spectrometer and a light source are used to measure both the emitted and the reflected light from a surface which is at an elevated temperature relative to its environment. In a first method, the temperature of the surface and emissivity in each wavelength is calculated from a knowledge of the spectrum and the measurement of the incident and reflected light. In the second method, the reflected light is measured from a reference surface having a known reflectivity and the same geometry as the surface of interest and the emitted and the reflected light are measured for the surface of interest. These measurements permit the computation of the emissivity in each channel of the spectrometer and the temperature of the surface of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.